ResearchWho?

김오현

Emeritus Professor

포항공과대학교 전자전기공학과

논문[53]

#53. Effect of Rising Edge during Dynamic Stress With Duty Ratio in Amorphous InGaZnO Thin Film Transistors

2016.7.12 · Journal of Display Technology · 12(10):1078-1082

(DOI) https://doi.org/10.1109/JDT.2016.2590566

#52. Improving graphene non-volatile memory using self-aligned gate

2016.2 · Electronics Letters 52(9)

(DOI) https://doi.org/10.1049/el.2015.4274

프로시딩[3]

#3. Highly reliable a-Si TFTs gate driver with voltage control function according to threshold voltage shift and temperature change

2013.7.02:227-230

#2. Investigation on the degradation of MOSFETs characteristics due to localized Cu contamination

2002.11.06:126-127

(DOI) https://doi.org/10.1109/IMNC.2002.1178576