#2. Detecting Abnormal Behavior of Wafer Test Equipment using Auto-encoder with Event Log Data
2022 INFORMS Annual Meeting, Indiana, USA
2022.10.16 - 2022.10.19
#1. Suspicious Machine Screening in Serial–Parallel Multistage Manufacturing Process with a Nominal Quality Feature: A Production Log Data-based Approach
2022 INFORMS Annual Meeting, Indiana, USA
2022.10.16 - 2022.10.19
책[1]
저자
#1. Industrial Egineering Opening to a Smart World