ResearchWho?
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    정일섭
    Position 교수
    Current Department 성균관대학교 정보통신대학 전자전기공학부
    프로필
    연구 성과
    논문[112]
    #112. Characterization of GeO2 films formed on Ge substrate using high pressure oxidation
    Journal Information 2021.6 · Journal of Vacuum Science & Technology
    Identifier (DOI) https://doi.org/10.1116/6.0000963
    #111. Property Improvement of CTF Memories Utilizing Hybrid Tunnel Oxide
    Journal Information 2018.2.21 · IEEE Transactions on Electron Devices · 65(4):1355-1362
    Identifier (DOI) https://doi.org/10.1109/TED.2018.2803140
    프로시딩[6]
    #6. Study on off-state hot carrier degradation and recovery of NMOSFET in SWD circuits of DRAM
    Journal Information 2016.10.09:91-94
    Identifier (DOI) https://doi.org/10.1109/IIRW.2016.7904910
    #5. MOSFET implant failure analysis using plane-view scanning capacitance microscopy coupled with nano-probing and TCAD modeling
    Journal Information 2014.6.30:5-8
    Identifier (DOI) https://doi.org/10.1109/IPFA.2014.6898128
    특허[6]
    #6. 더미 드레인층을 이용한 수직 실린더형
    Identifier [출원] 10-20070081465.
    Patent Country 대한민국
    #5. 피넛 형상의 채널층을 갖는 전계효과 트랜지스터 및 그 제조방법.
    Identifier [출원] 10-2007-0081464
    Patent Country 대한민국
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