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    양철웅
    Position 교수
    Current Department 성균관대학교 정보통신대학 소재부품융합공학과
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    논문[113]
    #113. Improving STEM scale calibration reliability with scanning noise correction and image registration
    Journal Information 2022.10
    Identifier (DOI) https://doi.org/10.21203/rs.3.rs-2130064/v1
    #112. Novel Method of Measuring the Thickness of Nanoscale Films Using Energy Dispersive X‐Ray Spectroscopy Line Scan Profiles
    Journal Information 2022.03 · Advanced Materials Interfaces
    Identifier (DOI) https://doi.org/10.1002/admi.202101489
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